The research team of Xiamen University and Taiwan’s Hsinchu Jiaotong University (Guo Haozhong, Wu Tingzhu, Zhao Qingwei) recently developed a micro-LED surface brightness detection system based on microscopic imaging system, which can quickly measure the position of micro-LED array at any position during operation. Absolute brightness value.

LEDs have existed for more than half a century as an active self-illuminating device. Its low power consumption, low operating voltage, high illumination, long operating life and stable performance make it a very popular application. With the development of LED technology and the growing demand for micro-integration in various industries, micro-LED array devices have emerged. By further reducing the size of the LED chip, hundreds or thousands of micro-LEDs can be fabricated in the millimeter range to form a micro-LED array. micro-LEDs have potential applications in many areas, including micro-LED displays, high-speed parallel visible light communications, and high-voltage lighting chips.

In the display field, compared with LCD and OLED display technologies, micro-LED displays have the advantages of high luminous efficiency, high brightness, high contrast, and short response time. However, due to heat dissipation, aging and other problems, the imaging defects of the display affect the imaging quality, so the defect detection of the display is necessary. However, current measurement measurements remain at a macro level and cannot be used to accurately measure micro LED arrays, and the method used to evaluate the brightness of micro-LED arrays focuses on the measurement of total brightness, failing to quickly detect bad pixels in the micro LED array. . Therefore, it is very necessary to find a fast and accurate method to check the surface brightness of the micro-LED.

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